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Fast wavefront sensing for X-ray optics with an alternating speckle tracking technique

DOI: 10.1364/OE.460163 DOI Help

Authors: Lingfei Hu (Diamond Light Source) , Hongchang Wang (Diamond Light Source) , Oliver Fox (Diamond Light Source) , Kawal Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Optics Express , VOL 30

State: Published (Approved)
Published: August 2022

Open Access Open Access

Abstract: Advances in accelerator technologies have enabled the continuous development of synchrotron radiation and X-ray free electron laser (XFEL) sources. At the same time, it has been critical to perform in-situ wavefront sensing to aid delivery of high-quality X-ray beams to the end users of these facilities. The speckle-based scanning technique has obtained popularity due to its high spatial resolution and superior sensitivity compared to other wavefront sensing methods. However, these advantages often come at the expense of longer data acquisition times since multiple images have to be collected to derive the necessary wavefront information. Whereas initial speckle tracking techniques could obtain wavefront information relatively quickly, the installation of additional hardware was routinely required to do so. Here, we propose a novel speckle-based approach, termed Alternating Speckle Tracking (AST), to perform fast wavefront sensing within a conventional beamline setup. The wavefront information derived from the new technique has proven to be valuable for many applications that require temporal resolution. Importantly, both horizontal and vertical wavefront information can be simultaneously derived by moving the speckle generator along the diagonal direction. We expect this method will be widely used by the synchrotron radiation and XFEL community in the future.

Subject Areas: Physics, Technique Development


Instruments: B16-Test Beamline

Added On: 26/08/2022 15:52

Documents:
oe-30-18-33259.pdf

Discipline Tags:

Optics Physics Technique Development - Physics

Technical Tags:

Diffraction