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First observation of new flat line Fano profile via an X-ray planar cavity

DOI: 10.1103/PhysRevLett.129.213602 DOI Help

Authors: Zi-Ru Ma (University of Science and Technology of China) , Xin-Chao Huang (University of Science and Technology of China) , Tian-Jun Li (University of Science and Technology of China) , Hong-Chang Wang (Diamond Light Source) , Gen-Chang Liu (Tongji University) , Zhan-Shan Wang (Tongji University) , Bo Li (University of Science and Technology of China) , Wen-Bin Li (Tongji University) , Lin-Fan Zhu (University of Science and Technology of China)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Physical Review Letters , VOL 129

State: Published (Approved)
Published: November 2022
Diamond Proposal Number(s): 21446

Abstract: A new Fano profile of a flat line is achieved experimentally by manipulating the relative amplitude of the continuum path, when q takes the pure imaginary number of − i in the x-ray regime. The underlying mechanism is that the interference term in the scattering will cancel the discrete term exactly. This new Fano profile renders only an observable continuum along with an invisible response to the discrete state of atomic resonance. The results suggest not only a different strategy to invisibility studies which provides a possible tool to identify weaker structures hidden by the strong white line, but also a new scenario to enrich the manipulations of two-path interference and nonlinear Fano resonance.

Journal Keywords: Atoms, ions, & molecules in cavities; Cavity quantum electrodynamics; Coherent control; Single- and few-photon ionization & excitation; X-ray scattering

Subject Areas: Physics


Instruments: B16-Test Beamline

Added On: 17/11/2022 08:53

Discipline Tags:

Physics

Technical Tags:

Scattering