Versatile domain mapping of scanning electron nanobeam diffraction datasets utilising variational autoencoders

DOI: 10.1038/s41524-022-00960-y

Authors: A. Bridger (University of Oxford; ISIS Neutron and Muon Spallation Source; Diamond Light Source) , W. I. F. David (University of Oxford; ISIS Neutron and Muon Spallation Source) , T. J. Wood (ISIS Neutron and Muon Spallation Source) , M. Danaie (Diamond Light Source) , K. T. Butler (Queen Mary University of London)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Npj Computational Materials , VOL 9

State: Published (Approved)
Published: January 2023
Diamond Proposal Number(s): 19064 , 28749

Abstract: Characterisation of structure across the nanometre scale is key to bridging the gap between the local atomic environment and macro-scale and can be achieved by means of scanning electron nanobeam diffraction (SEND). As a technique, SEND allows for a broad range of samples, due to being relatively tolerant of specimen thickness with low electron dosage. This, coupled with the capacity for automation of data collection over wide areas, allows for statistically representative probing of the microstructure. This paper outlines a versatile, data-driven approach for producing domain maps, and a statistical approach for assessing their applicability. The workflow utilises a Variational AutoEncoder to identify the sources of variance in the diffraction signal, and this, in combination with clustering techniques, is used to produce domain maps. This approach is agnostic to domain crystallinity, requires no prior knowledge of crystal structure, and does not require simulation of a library of expected diffraction patterns.

Subject Areas: Technique Development, Materials, Information and Communication Technology

Diamond Offline Facilities: Electron Physical Sciences Imaging Centre (ePSIC)
Instruments: E02-JEM ARM 300CF

Added On: 01/03/2023 11:15

Documents:
s41524-022-00960-y.pdf

Discipline Tags:

Technique Development - Materials Science Information & Communication Technologies Materials Science Data processing

Technical Tags:

Microscopy Electron Microscopy (EM) Scanning Transmission Electron Microscopy (STEM)