Application of a new method for accurate determination of α and β texture in Ti-6Al-4 V from synchrotron diffraction intensities

DOI: 10.1016/j.matchar.2023.112769

Authors: Christopher S. Daniel (The University of Manchester) , Xiaohan Zeng (The University of Manchester) , Stefan Michalik (Diamond Light Source) , Simon A. Hunt (The University of Manchester) , Joao Quinta Da Fonseca (The University of Manchester)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Materials Characterization

State: Published (Approved)
Published: March 2023
Diamond Proposal Number(s): 25682

Abstract: The crystallographic texture development during processing of dual-phase Ti alloys like Ti-6Al-4 V is of fundamental technological importance. However, measuring texture in both phases in these materials is a significant challenge because of the spatial inhomogeneity of the texture and low volume fraction of the minority β-phase at room temperature. Here we demonstrate how synchrotron X-ray diffraction can be used to overcome these difficulties and measure texture and texture variation in hot-rolled samples in a reproducible manner. The texture in hot-rolled Ti-64 was calculated from 2D synchrotron diffraction patterns obtained along different directions. The data was analysed using MAUD, which is based on Rietveld refinement of the diffracted intensities, and using a Fourier series based analysis method, that extracts intensities directly from the 2D diffraction patterns, and then uses the open-source software MTEX to fit an orientation distribution function (ODF). By comparing the results with faithful EBSD measurements, we show that the Fourier series method produces much more accurate texture measurements, especially for the minority β-phase. We also show that a minimum of 2, and preferably 3, different measurement orientations are needed to fully represent the texture. This implies that measurements of texture which rely on diffraction data from a single sample orientation, like in fast in-situ studies or spatially resolved measurements, can only provide qualitative information and must be interpreted with care.

Journal Keywords: Crystallographic texture; Synchrotron diffraction; ti64; Thermomechanical processing

Diamond Keywords: Alloys

Subject Areas: Materials, Technique Development, Engineering


Instruments: I12-JEEP: Joint Engineering, Environmental and Processing

Added On: 06/03/2023 10:40

Documents:
1-s2.0-S1044580323001262-main.pdf

Discipline Tags:

Technique Development - Materials Science Materials Engineering & Processes Materials Science Engineering & Technology Metallurgy

Technical Tags:

Diffraction