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Phase-resolved x-ray ferromagnetic resonance measurements in fluorescence yield

DOI: 10.1063/1.3567143 DOI Help

Authors: M. Marcham (School of Physics, University of Exeter) , P. S. Keatley (University of Exeter) , A. Neudert (Forschungszentrum Dresden-Rossendorf e. V.) , R. Hicken (University of Exeter) , S. Cavill (University of York, Diamond Light Source) , L. Shelford (Diamond Light Source) , G. Van Der Laan (Diamond Light Source) , N. Telling (University of Manchester) , J. Childress (Hitachi Global Storage Technologies) , J. Katine (Hitachi Global Storage Technologies) , P. Shafer (Lawrence Berkeley National Laboratory) , E. Arenholz (Lawrence Berkeley National Laboratory)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Applied Physics

State: Published (Approved)
Published: April 2011
Diamond Proposal Number(s): 1842

Abstract: Phase-resolved x-rayferromagnetic resonance (XFMR) has been measured in fluorescence yield, extending the application of XFMR to opaque samples on opaque substrates. Magnetization dynamics were excited in a Co50Fe50(0.7)/Ni90Fe10(5) bilayer by means of a continuous wave microwave excitation, while x-ray magnetic circular dichroism (XMCD) spectra were measured stroboscopically at different points in the precession cycle. By tuning the x-ray energy to the L 3 edges of Ni and Fe, the dependence of the real and imaginary components of the element specific magnetic susceptibility on the strength of an externally applied static bias field was determined. First results from measurements on a Co50Fe50(0.7)/Ni90Fe10(5)/Dy(1) sample confirm that enhanced damping results from the addition of the Dy cap.

Journal Keywords: Magnetism; Resonance

Subject Areas: Materials, Physics, Engineering

Instruments: I06-Nanoscience

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