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The nanoscale morphology of a PCDTBT:PCBM photovoltaic blend

DOI: 10.1002/aenm.201100144 DOI Help

Authors: Paul A. Staniec (The University of Sheffield) , Andrew J. Parnell (The University of Sheffield) , Alan D. F. Dunbar (The University of Sheffield) , Hunan Yi (The University of Sheffield) , Andrew J. Pearson (The University of Sheffield) , Paul E. Hopkinson (University of Cambridge) , Tao Wang (The University of Sheffield) , Christy Kinane (ISIS Pulsed Neutron and Muon Source) , Robert M. Dagliesh (ISIS Pulsed Neutron and Muon Source) , Athene M. Donald (University of Cambridge) , Anthony J. Ryan (The University of Sheffield) , Ahmed Iraqi (The University of Sheffield) , Richard A. L. Jones (The University of Sheffield) , David G. Lidzey (The University of Sheffield)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Advanced Energy Materials

State: Published (Approved)
Published: April 2011

Abstract: Neutron reflectivity and X-ray scattering have been used to characterise the structure of photovoltaic optimised PCDTBT:PCBM (1:4) blend films. A negative gradient of the PCBM forms spontaneously upon film casting – a fortuitous structure that is well matched for efficient charge extraction. Mild thermal annealing at 70 °C does not significantly modify the film structure, and any improvement in device efficiency is likely to be through the removal of trapped casting solvent.

Diamond Keywords: Photovoltaics; Semiconductors

Subject Areas: Materials, Physics, Energy


Instruments: I16-Materials and Magnetism

Other Facilities: Target Station 2 at ISIS

Added On: 05/05/2011 15:10

Discipline Tags:

Surfaces Earth Sciences & Environment Sustainable Energy Systems Energy Physics Climate Change Energy Materials Materials Science interfaces and thin films

Technical Tags:

Scattering Wide Angle X-ray Scattering (WAXS) Grazing Incidence Wide Angle Scattering (GIWAXS)