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The Nanoscale Morphology of a PCDTBT:PCBM Photovoltaic Blend

DOI: 10.1002/aenm.201100144 DOI Help

Authors: Paul Staniec (University of Sheffield) , Andy Parnell (University of Sheffield) , Alan Dunbar (University of Sheffield) , Hunan Yi , Andrew Pearson (University of Sheffield) , Paul Hopkinson (University of Cambridge) , Tao Wang (University of Sheffield) , Christy Kinane (ISIS Pulsed Neutron and Muon Source) , R Dagliesh , Athene Donald , Anthony Ryan , Ahmed Iraqi , Richard Jones , David Lidzey (University of Sheffield)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Advanced Energy Materials

State: Published (Approved)
Published: April 2011

Abstract: Neutron reflectivity and X-ray scattering have been used to characterise the structure of photovoltaic optimised PCDTBT:PCBM (1:4) blend films. A negative gradient of the PCBM forms spontaneously upon film casting – a fortuitous structure that is well matched for efficient charge extraction. Mild thermal annealing at 70 °C does not significantly modify the film structure, and any improvement in device efficiency is likely to be through the removal of trapped casting solvent.

Subject Areas: Materials


Instruments: I16-Materials and Magnetism