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Characterization of wax as a potential diffraction intensity standard for macromolecular crystallography beamlines

DOI: 10.1107/S0909049509040709 DOI Help
PMID: 20029111 PMID Help

Authors: Jose Brandao-neto (Diamond Light Source) , Alistair Lennie (Diamond Light Source) , F Ferreira (Laboratorio Nacional de Luz Sincrotron) , Chiu Tang (Diamond Light Source) , Stephen Thompson (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation , VOL 17 (1) , PAGES 53-60

State: Published (Approved)
Published: January 2010

Abstract: A number of commercially available waxes in the form of thin disc samples have been investigated as possible diffraction intensity standards for macromolecular crystallography synchrotron beamlines. Synchrotron X-ray powder diffraction measurements show that beeswax offers the best performance of these waxes owing to its polycrystallinity. Crystallographic lattice parameters and diffraction intensities were examined between 281 and 309 K, and show stable and predictable thermal behaviour. Using an X-ray beam of known incident flux at [lambda] = 1 Å, the diffraction power of two strong Bragg reflections for beeswax were quantified as a function of sample thickness and normalized to 1010 photons s-1. To demonstrate its feasibility as a diffraction intensity standard, test measurements were then performed on a new third-generation macromolecular crystallography synchrotron beamline.

Journal Keywords: Beeswax; Macromolecular Crystallography; Mx Intensity Standard; Synchrotron Powder Diffraction.

Subject Areas: Technique Development

Instruments: I04-1-Macromolecular Crystallography (fixed wavelength) , I11-High Resolution Powder Diffraction

Other Facilities: Laboratório Nacional de Luz Síncrotron (LNLS)