Characterisation of Redlen HF-CdZnTe at > 106 ph s-1 mm-2 using HEXITECMHz

DOI: 10.1088/1748-0221/19/04/P04028

Authors: B. D. Cline (UKRI STFC Rutherford Appleton Laboratory) , D. Banks (UKRI STFC Rutherford Appleton Laboratory) , S. Bell (UKRI STFC Rutherford Appleton Laboratory) , I. Church (UKRI STFC Rutherford Appleton Laboratory) , A. Davis (UKRI STFC Rutherford Appleton Laboratory) , T. Gardiner (UKRI STFC Rutherford Appleton Laboratory) , J. Harris (UKRI STFC Rutherford Appleton Laboratory) , M. Hart (UKRI STFC Rutherford Appleton Laboratory) , L. Jones (UKRI STFC Rutherford Appleton Laboratory) , T. Nicholls (UKRI STFC Rutherford Appleton Laboratory) , J. Nobes (UKRI STFC Rutherford Appleton Laboratory) , S. Pradeep (UKRI STFC Rutherford Appleton Laboratory) , M. Roberts (UKRI STFC Rutherford Appleton Laboratory) , D. Sole (UKRI STFC Rutherford Appleton Laboratory) , M. C. Veale (UKRI STFC Rutherford Appleton Laboratory) , M. D. Wilson (UKRI STFC Rutherford Appleton Laboratory) , V. Dhamgaye (Diamond Light Source) , O. Fox (Diamond Light Source) , K. Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Instrumentation , VOL 19

State: Published (Approved)
Published: April 2024
Diamond Proposal Number(s): 32772

Abstract: In this paper, results are presented from the characterisation of Redlen Technologies high-flux-capable Cadmium Zinc Telluride (HF-CZT) hybridised to the HEXITECMHz ASIC, a novel 1 MHz continuous X-ray imaging system. A 2 mm thick HF-CZT HEXITECMHz detector was characterised on the B16 Test Beamline at the Diamond Light Source and displayed an average FWHM of 850 eV for monochromatic X-rays of energy 20 keV. Measurements revealed a shift in the baseline of irradiated pixels that results in a movement of the entire spectrum to higher ADU values. Datasets taken to analyse the effect's dynamics showed it to be highly localised and flux-dependent, with the excess leakage current generated equivalent to per-pixel shifts of ∼ 543 pA (8.68 nA mm-2) at a flux of 1.26×107 ph s-1 mm-2. Comparison to results from a p-type Si HEXITECMHz device indicate this `excess leakage-current' effect is unique to HF-CZT and it is hypothesised that it originates from trapping at the electrode-CZT interface and a temporary modification of the potential barrier between the CZT and metal electrode.

Subject Areas: Physics, Engineering


Instruments: B16-Test Beamline

Added On: 29/04/2024 09:08

Documents:
Cline_2024_J._Inst._19_P04028.pdf

Discipline Tags:

Detectors Physics Engineering & Technology

Technical Tags:

Imaging