Development of multilayer monochromators for stripe-free X-ray imaging

DOI: 10.1364/OE.562887

Authors: Riley Shurvinton (Diamond Light Source) , Paresh Pradhan (Diamond Light Source) , Murilo Bazan Da Silva (Diamond Light Source) , Wadwan Singhapong (Diamond Light Source; University of Bath) , Wai Jue Tan (Diamond Light Source) , Arindam Majhi (Diamond Light Source) , Vishal Dhamgaye (Diamond Light Source) , Hongchang Wang (Diamond Light Source) , Kawal Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Optics Express , VOL 33

State: Published (Approved)
Published: August 2025

Abstract: Multilayer (ML) monochromators are essential components in synchrotron radiation facilities, widely used for X-ray imaging and X-ray diffraction, as well as select X-ray spectroscopy techniques. However, ML monochromators introduce stripe artefacts to the reflected beam, which degrade the quality of the X-ray images. These stripe artefacts originate from figure errors on the monochromator’s surface, which are challenging to minimise for most manufacturers. In this study, we demonstrate stripe-free imaging from ultra-high-quality ML monochromators. We employed a state-of-the-art ion beam figuring (IBF) technique to produce multilayer substrates with a cutting-edge slope error of less than 30 nrad root mean squared (rms). These substrates were coated in an advanced multilayer deposition system, enabling the production of uniform multilayer coatings. The performance of the ML monochromators was tested at the B16 test beamline at the diamond light source. Speckle-based metrology was used to verify the theoretical link between wavefront curvature and the appearance of stripe artefacts. We obtained stripe-free X-ray images from the newly fabricated ML monochromators in both single-bounce and double-bounce configurations, with excellent image clarity and flat field uniformity. This represents a breakthrough in the production of ML monochromators.

Subject Areas: Physics, Engineering


Instruments: B16-Test Beamline

Added On: 11/08/2025 08:43

Documents:
oe-33-16-34814.pdf

Discipline Tags:

Optics Physics Engineering & Technology

Technical Tags:

Imaging