Soft X-ray resonant magnetic scattering from a Ni layer with modulated magnetic anisotropy

DOI: 10.1107/S0909049504004868
PMID: 15103112

Authors: A. Haznar (Daresbury Laboratory, U.K.) , G. Van Der Laan (Diamond Light Source) , S. P. Collins (Diamond Light Source) , C.a.f Vaz (Cavendish Laboratory, University of Cambridge, U.K.) , J. A. C. Bland (Cavendish Laboratory, University of Cambridge, U.K.) , S. S. Dhesi (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation , VOL 11 , PAGES 254 - 260

State: Published (Approved)
Published: May 2004

Abstract: Soft X-ray resonant magnetic scattering studies on a magnetically modulated, but nominally chemically homogenous, 5 nm Ni layer in a Cu/Ni/Cu/Co/NiO/GaAs(110) system are reported. It was possible to estimate the main chemical structure of the sample on the basis of the results from specular reflectivity and rocking scans, probing the scattering vector components in the perpendicular and in-plane direction to the Ni wires, respectively. The magnetic scattering using polarized X-rays demonstrates the magnetic modulation of the Ni layer.

Journal Keywords: X-Ray Resonant Magnetic Scattering; Nanostructures.

Subject Areas: Physics

Facility: ESRF