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Characterisation of vapour grown CdZnTe crystals using synchrotron X-ray topography

DOI: 10.1016/j.jcrysgro.2012.01.003 DOI Help

Authors: Christopher K. Egan (University of Manchester) , Ashutosh Choubey (Durham University) , Moreton Moore (Royal Holloway University of London) , Robert J. Cernik (University of Manchester)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Crystal Growth , VOL 343 (1) , PAGES 1-6

State: Published (Approved)
Published: January 2012
Diamond Proposal Number(s): 2933

Abstract: Synchrotron white beam X-ray topography has been used to characterise bulk crystal defects of thick vapour grown CdZnTe crystals. Whole 50 mm diameter wafers with thicknesses in the range of 2–3 mm were sliced from boules grown by the multi-tube physical vapour transport method and analysed by diffraction topography in a transmission geometry. A variety of defects were observed including cracks, voids and grain boundaries. The largest quantity of defects observed were sub-grains appearing as localised increased intensity in the topographs. The periphery of the wafers showed the highest number of defects, whereas central regions where largely defect-free. We failed to observe any inclusions or precipitates within these crystals. Surface damage from wire-saw cutting was also observed on poorly processed wafers; these defects were otherwise invisible to standard characterisation methods. X-ray topography has proven to be a useful tool for non-destructively investigating bulk extended defects in CdZnTe crystals for radiation detector applications.

Journal Keywords: Defects; X-Ray Topography; Growth From Vapour; Vapour Phase Epitaxy; Semiconducting Ii–Vi Materials

Subject Areas: Materials, Technique Development, Engineering


Instruments: I12-JEEP: Joint Engineering, Environmental and Processing

Added On: 17/01/2012 16:15

Discipline Tags:

Detectors Technique Development - Materials Science Materials Science Engineering & Technology

Technical Tags:

Microscopy X-ray Microscopy Topography