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Electron bunch profile reconstruction in the few fs regime using coherent Smith-Purcell radiation

DOI: 10.1088/1748-0221/7/01/P01009 DOI Help

Authors: R. Bartolini (John Adams Institute, University of Oxford; Diamond Light Source) , C. Clarke (SLAC) , N. Delerue (John Adams Institute, University of Oxford; Diamond Light Source; SLAC) , G. Doucas (John Adams Institute, University of Oxford) , A. Reichold (John Adams Institute, University of Oxford)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Instrumentation , VOL 7 , PAGES P01009 - P01009

State: Published (Approved)
Published: January 2012

Abstract: Advanced accelerators for fourth generation light sources based on high brightness linacs or laser-driven wakefield accelerators will operate with intense, highly relativistic electron bunches that are only a few fs long. Diagnostic techniques for the determination of temporal profile of such bunches are required to be non invasive, single shot, economic and with the required resolution in the fs regime. The use of a radiative process such as coherent Smith-Purcell radiation (SPR), is particularly promising with this respect. In this technique the beam is made to radiate a small amount of electromagnetic radiation and the temporal profile is reconstructed from the measured spectral distribution of the radiation. We summarise the advantages of SPR and present the design parameters and preliminary results of the experiments at the FACET facility at SLAC. We also discuss a new approach to the problem of the recovery of the `missing phase', which is essential for the accurate reconstruction of the temporal bunch profile.

Journal Keywords: Beam-Line Instrumentation (Beam Position And Profile Monitors; Beam-Intensity Monitors;Bunch Length Monitors); Accelerator Subsystems And Technologies

Subject Areas: Physics

Instruments: B22-Multimode InfraRed imaging And Microspectroscopy

Added On: 18/01/2012 11:55

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Spectroscopy Infrared Spectroscopy Synchtron-based Fourier Transform Infrared Spectroscopy (SR-FTIR)