Domain wall velocity measurement in permalloy nanowires with X-ray magnetic circular dichroism imaging and single shot Kerr microscopy

DOI: 10.1016/j.jmmm.2009.06.048

Authors: T. A. Moore (Universität Konstanz) , M. Klaui (University of Konstanz) , L. Heyne (University of Konstanz) , P. Möhrke (Universität Konstanz) , D. Backes (Paul Scherrer Institute) , J. Rhensius (Paul Scherrer Institute; Universität Konstanz) , U. Rüdiger (Universität Konstanz) , L. J. Heyderman (Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut) , T. O. Mentes (Sincrotrone Trieste) , M. A. Niño (Sincrotrone Trieste) , A. Locatelli (Sincrotrone Trieste) , A. Potenza (Diamond Light Source) , S. S. Dhesi (Diamond Light Source) , S. Cavill (University of York; Diamond Light Source) , H. Marchetto (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Magnetism And Magnetic Materials

State: Published (Approved)
Published: June 2009

Abstract: Domain walls (DWs) propagated along nanoscale magnetic wires by current or field pulses could potentially be used for data storage or logic applications, but the understanding of the DW dynamics, particularly under the influence of spin-polarized current, is incomplete. Measuring the velocity can give insights into the physics of the DW motion. Here we demonstrate DW velocity measurements in permalloy (Ni80Fe20Ni80Fe20) nanowires (1500 nm width and 20 nm thickness) using the techniques of X-ray magnetic circular dichroism photoemission electron microscopy (XMCD-PEEM) to image the magnetic contrast in the nanowires, and single shot Kerr microscopy, which allows for dynamic measurements. The magnetic imaging yields the average velocity as well as information on the DW spin structure, whereas the single shot method highlights the stochastic nature of the DW motion.

Journal Keywords: Ferromagnetic Nanowire; Domain Wall Dynamics; Spin Torque

Diamond Keywords: Alloys

Subject Areas: Materials, Physics


Instruments: I06-Nanoscience (XPEEM)

Other Facilities: Elettra; Swiss Light Source

Added On: 03/02/2010 11:58

Discipline Tags:

Physics Electronics Magnetism Materials Science Nanoscience/Nanotechnology Metallurgy

Technical Tags:

Microscopy Spectroscopy Electron Microscopy (EM) PhotoEmmission Electron Microscopy (PEEM) Circular Dichroism (CD) X-ray Magnetic Circular Dichroism (XMCD)