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Evaluation of a second-generation ultra-fast energy-resolved ASIC for photon-counting spectral CT

DOI: 10.1109/TNS.2012.2228276 DOI Help

Authors: Cheng Xu (Royal Institute of Technology) , Mats Persson (Royal Institute of Technology) , Moa Yveborg (Royal Institute of Technology) , Han Cheng (Royal Institute of Technology) , Staffan Karlsson (Royal Institute of Technology) , Mats Danielsson (Royal Institute of Technology) , Christer Svensson (Linkoping University, Sweden) , Hans Bornefalk (Royal Institute of Technology)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Ieee Transactions On Nuclear Science , VOL 60 (1) , PAGES 437-445

State: Published (Approved)
Published: February 2013
Diamond Proposal Number(s): 5676

Abstract: A second-generation ultra-fast energy-resolved application specific integrated circuit (ASIC) has been developed for photon-counting spectral computed tomography (CT). The energy resolution, threshold dispersion and gain of the ASIC were characterized with synchrotron radiation at Diamond Light Source. The standard deviation of threshold offsets at zero keV is 0.89 keV. An RMS energy resolution of 1.09 keV has been demonstrated for 15 keV photon energy at a count rate of 40 kcps, and it deteriorates at a rate of 0.29 keV/Mcps with the increase of output cout rate. The count rate performance of the ASIC has also been evaluated with 120 kV polychromatic x-rays produced by a tungsten anode tube and the results are presented.

Journal Keywords: Photon Counting; Spectral Ct; Silicon Strip Detector; Asic; Synchrotron

Subject Areas: Engineering, Physics, Technique Development


Instruments: B16-Test Beamline