Article Metrics


Online attention

Synchrotron Tests of a 3D Medipix2 X-Ray Detector

DOI: 10.1109/TNS.2009.2037746 DOI Help

Authors: David Pennicard (University of Glasgow) , Julien Marchal (Diamond Light Source) , Celeste Fleta (University of Glasgow) , Giulio Pellegrini (CNM-IMB (CSIC)) , Manuel Lozano (Instituto de Microelectronica de Barcelona, IMB-CNM-CSIC) , Christopher Parkes (University of Glasgow) , Damien Barnett (Diamond Light Source) , Nicola Tartoni (Diamond Light Source) , Igor Dolbnya (Diamond Light Source) , Kawal Sawhney (Diamond Light Source) , Richard Bates (Department of Physics and Astronomy, University of Glasgow) , Val O'shea (University of Glasgow) , Victoria Wright (Science and Technology Facilities Council)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Ieee Transactions On Nuclear Science , VOL 57 (1) , PAGES 387-394

State: Published (Approved)
Published: February 2010

Abstract: Three-dimensional (3D) photodiode detectors offer advantages over standard planar photodiodes in a range of applications, including X-ray detection for synchrotrons and medical imaging. The principal advantage of these sensors for X-ray imaging is their low charge sharing between adjacent pixels, which could improve spatial and spectral resolution. A 'double-sided' 3D detector has been bonded to a Medipix2 single-photon-counting readout chip, and tested in a monochromatic X-ray beam at the Diamond synchrotron. Tests of the 3D detector's response spectrum and its Line Spread Function have shown that it has substantially lower charge sharing than a standard planar Medipix2 sensor. Additionally, the 3D detector was used to image diffraction rings produced by a powdered silicon sample, demonstrating the detector's use in a standard synchrotron experiment.

Journal Keywords: Position Sensitive Detectors; Silicon Radiation Detectors; Solid State Detectors; Synchrotron Radiation; X-Ray Detectors; X-Ray Imaging

Subject Areas: Technique Development

Instruments: B16-Test Beamline

Added On: 02/03/2010 10:44

Discipline Tags:

Technical Tags: