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X-ray diffraction study of a Si & sigma 13 symmetric tilt grain boundary
DOI:
10.1017/S2044820110000523
Authors:
S. D.
Rhead
(University of Leicester, U.K.)
,
P. B.
Howes
(University of Leicester)
,
M.
Roy
(Department of Physics and Astronomy, University of Leicester)
,
J. L.
Rawle
(Diamond Light Source)
,
C.
Nicklin
(Diamond Light Source)
,
C.
Norris
(Diamond Light Source)
Co-authored by industrial partner:
No
Type:
Conference Paper
Conference:
SRMS 2011
Peer Reviewed:
No
State:
Published (Approved)
Published:
October 2010
Diamond Proposal Number(s):
2072
Abstract: We present an X-ray diffraction study of a semiconductor symmetric tilt grain boundary. The theory of crystal truncation rod scattering is extended to bicrystal interfaces and compared with experimental data measured at the Diamond Light Source.
Journal Keywords: Bicrystal; X-Ray Diffraction
Subject Areas:
Materials,
Physics
Instruments:
I07-Surface & interface diffraction
Discipline Tags:
Technical Tags: