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X-ray diffraction study of a Si & sigma 13 symmetric tilt grain boundary

DOI: 10.1017/S2044820110000523 DOI Help

Authors: S. D. Rhead (University of Leicester, U.K.) , P. B. Howes (University of Leicester) , M. Roy (Department of Physics and Astronomy, University of Leicester) , J. L. Rawle (Diamond Light Source) , C. Nicklin (Diamond Light Source) , C. Norris (Diamond Light Source)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: SRMS 2011
Peer Reviewed: No

State: Published (Approved)
Published: October 2010
Diamond Proposal Number(s): 2072

Abstract: We present an X-ray diffraction study of a semiconductor symmetric tilt grain boundary. The theory of crystal truncation rod scattering is extended to bicrystal interfaces and compared with experimental data measured at the Diamond Light Source.

Journal Keywords: Bicrystal; X-Ray Diffraction

Subject Areas: Materials, Physics


Instruments: I07-Surface & interface diffraction