Publication

Article Metrics

Citations


Online attention

X-ray beam monitor made by thin-film CVD single-crystal diamond

DOI: 10.1107/S0909049512038186 DOI Help
PMID: 23093764 PMID Help

Authors: M. Marinelli (Università di Roma 'Tor Vergata') , E. Milani (Università di Roma 'Tor Vergata') , G. Prestopino (Università di Roma 'Tor Vergata') , Claudio Verona (Università di Roma 'Tor Vergata') , G. Verona-rinati (Università di Roma 'Tor Vergata') , M. Angelone (Associazione EURATOM-ENEA sulla Fusione) , M. Pillon (Associazione EURATOM-ENEA sulla Fusione) , V. Kachkanov (Diamond Light Source) , N. Tartoni (Diamond Light Source) , M. Benetti (CNR, Istituto di Acustica 'O.M. Corbino') , D. Cannatà (CNR, Istituto di Acustica 'O.M. Corbino') , F. Di Pietrantonio (CNR, Istituto di Acustica 'O.M. Corbino')
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation , VOL 19 (6) , PAGES 1015 - 1020

State: Published (Approved)
Published: November 2012

Abstract: A novel beam position monitor, operated at zero bias voltage, based on high-quality chemical-vapor-deposition single-crystal Schottky diamond for use under intense synchrotron X-ray beams was fabricated and tested. The total thickness of the diamond thin-film beam monitor is about 60 µm. The diamond beam monitor was inserted in the B16 beamline of the Diamond Light Source synchrotron in Harwell (UK). The device was characterized under monochromatic high-flux X-ray beams from 6 to 20 keV and a micro-focused 10 keV beam with a spot size of approximately 2 µm × 3 µm square. Time response, linearity and position sensitivity were investigated. Device response uniformity was measured by a raster scan of the diamond surface with the micro-focused beam. Transmissivity and spectral responsivity versus beam energy were also measured, showing excellent performance of the new thin-film single-crystal diamond beam monitor.

Journal Keywords: Cvd Diamond; Beam Position Monitor; X-Ray Detector; Schottky Diode.

Subject Areas: Technique Development


Instruments: B16-Test Beamline

Added On: 03/11/2012 16:21

Discipline Tags:



Technical Tags: