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Complete polarization analysis of an APPLE II undulator using a soft X-ray polarimeter

DOI: 10.1107/S0909049512034851 DOI Help
PMID: 23093753 PMID Help

Authors: Hongchang Wang (Diamond Light Source) , Peter Bencok (Diamond Light Source) , Paul Steadman (Diamond Light Source) , Emily Longhi (Diamond Light Source) , Jingtao Zhu (Diamond Light Source) , Zhanshan Wang (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation , VOL 19 (6) , PAGES 944 - 948

State: Published (Approved)
Published: November 2012

Abstract: Two APPLE II undulators installed on the Diamond I10 beamline have all four magnet arrays shiftable and thus can generate linear polarization at any arbitrary angle from 0° to 180°, as well as all other states of elliptical polarization. To characterize the emitted radiation polarization state from one APPLE II undulator, the complete polarization measurement was performed using a multilayer-based soft X-ray polarimeter. The measurement results appear to show that the linear polarization angle offset is about 6° compared with other measurements at 712 eV, equivalent to an undulator jaw phase offset of 1.1 mm. In addition, the polarization states of various ellipticities have also been measured as a function of the undulator row phase.

Journal Keywords: Polarization; Multilayers; Undulators

Subject Areas: Engineering, Technique Development

Instruments: I10-Beamline for Advanced Dichroism

Added On: 04/11/2012 07:04

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