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Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping
Authors:
Slava
Kachkanov
(Diamond Light Source)
,
Igor
Dolbnya
(Diamond Light Source)
,
Kevin
O'donnell
(Department of Physics, SUPA, University of Strathclyde)
,
Katharina
Lorenz
(Instituto Tecnologico e Nuclear, Estrada Nacional)
,
Sergio
Pereira
(CICECO, Departamento de Fisica and I3N, Universidade de Aveiro)
,
Ian
Watson
(Institute of Photonics, SUPA, University of Strathclyde)
,
Thomas
Sadler
(Tyndall National Institute, University College Cork)
,
Haoning
Li
(Tyndall National Institute, University College Cork)
,
Vitaly
Zubialevich
(Tyndall National Institute, University College Cork)
,
Peter
Parbrook
(Tyndall National Institute, University College Cork)
Co-authored by industrial partner:
No
Type:
Journal Paper
Journal:
Physica Status Solidi (c)
State:
Published (Approved)
Published:
December 2012
Abstract: X-ray Reciprocal Space Mapping (RSM) is a powerful tool to explore the structure of semiconductor materials. However, conventional lab-based RSMs are usually measured in two dimensions (2D) ignoring the third dimension of diffraction-space volume. We report the use of a combination of X-ray microfocusing and state-of-the-art 2D area detectors to study the full volume of diffraction–space while probing III-nitride materials on the microscale. (© 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
Journal Keywords: X-Ray Microdiffraction; Reciprocal Space Mapping; Synchrotron Radiation; Nitride Materials; Aluminium Nitrides; Diffuse Scattering; Focusing; Gallium Nitrides; Incidence Angle; Indium Nitrides; Lattice Parameters; Quantum Wells; Screw Dislocations
Subject Areas:
Physics
Instruments:
B16-Test Beamline