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Direct measurements of field-induced strain at magnetoelectric interfaces by grazing incidence x-ray diffraction

DOI: 10.1063/1.4773358 DOI Help

Authors: Madjid Abes (University of Kiel) , Christian Torsten Koops (University of Kiel) , Stjepan Bozidar Hrkac (University of Kiel) , H. Greve (University of Kiel) , E. Quandt (University of Kiel) , Steve Collins (Diamond Light Source) , Bridget Murphy (University of Kiel) , O. M. Magnussen (University of Kiel)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Applied Physics Letters , VOL 102 (1)

State: Published (Approved)
Published: January 2013

Abstract: The magnetic field induced strain at the interface of a magnetoelectric composite, consisting of a ZnO(001) piezoelectric substrate and an amorphous (Fe90Co10)78Si12B10 magnetostrictive layer, was directly determined by grazing incidence X-ray diffraction. Upon applying a magnetic field along the [110] direction, the ZnO single crystal is under tensile strain in [110] direction and compressive strain in [1-10] direction, in agreement with the magnetostriction in the (Fe90Co10)78Si12B10 layer. At room temperature, the saturation strain along [1-10] of about 3?×?10?5 is close to the saturation magnetostriction of the film measured with the cantilever bending technique.

Journal Keywords: Magnetic Fields; Zinc Oxide Films; Magnetostriction; Piezoelectric Materials; Ii-Vi Semiconductors

Subject Areas: Physics


Instruments: I16-Materials and Magnetism