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X-ray phase microscopy using the speckle tracking technique

DOI: 10.1063/1.4802729 DOI Help

Authors: Sebastien Berujon (Diamond Light Source) , Hongchang Wang (Diamond Light Source) , Ian Pape (Diamond Light Source) , Kawal Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Applied Physics Letters , VOL 102 (15)

State: Published (Approved)
Published: April 2013

Abstract: Hard X-ray phase microscopy using the Speckle Tracking technique is presented and the practical implementation of this microscope explained. It is demonstrated that the spatial resolution of the Speckle Tracking technique can be pushed down to the nanometer scale without sacrificing the angular sensitivity, which is in the tens of nanoradians range. Moreover, the method is suitable for the analysis of dynamic samples. Experimental demonstration of the method is given for the case of phase imaging of micrometer size polystyrene spheres using a Fresnel zone plate as a magnifying optical element.

Journal Keywords: Speckle; X-ray microscopy; X-ray optics; Spatial resolution; Speckle patterns

Subject Areas: Technique Development

Instruments: B16-Test Beamline

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