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X-ray microscopy using two phase contrast imaging techniques: two dimensional grating interferometry and speckle tracking

DOI: 10.1088/1742-6596/463/1/012042 DOI Help

Authors: Hongchang Wang (Diamond Light Source) , Sebastien Berujon (Diamond Light Source) , Ian Pape (Diamond Light Source) , Kawal Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: 11th International Conference on X-ray Microscopy (XRM2012)
Peer Reviewed: No

State: Published (Approved)
Published: October 2013

Open Access Open Access

Abstract: Two phase contrast imaging techniques, namely two dimensional grating interferometry and X-ray speckle tracking (XST), have been combined with the use of a Fresnel Zone Plate (FZP) for application to X-ray microscopy. Both techniques allows the phase shift introduced by a sample on a hard X-ray beam in two dimensions, to be recovered with a high sensitivity and low requirements on transverse and longitudinal coherence. Sub-micron phase imaging of carbon fibres was achieved using the two methods thanks to the high magnification ratio of the FZP. Advantages, drawbacks and differences between these two techniques for X-ray microscopy are discussed.

Journal Keywords: Carbon Fibers; Gratings; Hard X Radiation; Interferometry; Microscopy; Phase Shift; Sensitivity

Subject Areas: Technique Development, Physics


Instruments: B16-Test Beamline