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Synchrotron Characterisation of Non-Uniformities in a Small Pixel Cadmium Zinc Telluride Imaging Detector

DOI: 10.1016/j.nima.2013.07.054 DOI Help

Authors: M. C. Veale (Rutherford Appleton Laboratory) , S. J. Bell (Rutherford Appleton Laboratory; University of Surrey) , D. D. Duarte (Rutherford Appleton Laboratory; University of Surrey) , A. Schneider (Rutherford Appleton Laboratory) , P. Seller (Rutherford Appleton Laboratory) , M. D. Wilson (STFC Central Microstructure Facility) , V. Kachkanov (Diamond Light Source) , K. J. S. Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Nuclear Instruments And Methods In Physics Research Section A: Accelerators, Spectrometers, Detectors And Associated Equipment

State: Published (Approved)
Published: July 2013

Abstract: A small pixel cadmium zinc telluride detector has been fabricated, assembled and tested at the Rutherford Appleton Laboratory. The detector consists of 74×74 pixels on a 250 ?m pitch with a 50 ?m spacing. Flat field irradiations with an 241Am ?-ray source have demonstrated that there are significant variations in the number of counts detected by each pixel as well as large differences in the FWHM of the X-ray photo-peak. A 10×10 ?m microbeam of 20 keV X-rays has been used to characterise these non-uniformities. These measurements have shown that variations in the counting and spectroscopic performance of individual pixels are due to the presence of a non-uniform electric field within the detector

Journal Keywords: Americium 241; Cadmium Compounds; Electric Fields; Gamma Detection; Kev Range; Performance; Position Sensitive Detectors; Solid Scintillation Detectors; Variations; X-Ray Detection; Zinc Tellurides

Subject Areas: Technique Development, Engineering, Physics

Instruments: B16-Test Beamline

Added On: 26/07/2013 13:20

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