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Silicon Σ13(5 0 1) grain boundary interface structure determined by bicrystal Bragg rod X-ray scattering

DOI: 10.1016/j.actamat.2013.06.011 DOI Help

Authors: P. Howes (University of Leicester, Department of Physics and Astronomy) , S. Rhead (University of Leicester, Department of Physics and Astronomy) , M. Roy (Department of Physics and Astronomy, University of Leicester) , C. Nicklin (Diamond Light Source) , J. Rawle (Diamond Light Source) , C. Norris (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Acta Materialia , VOL 61 (15) , PAGES 5694 - 5701

State: Published (Approved)
Published: July 2013

Abstract: The atomic structure of the silicon ?13(5 0 1) symmetric tilt grain boundary interface has been determined using Bragg rod X-ray scattering. In contrast to conventional structural studies of grain boundary structure using transmission electron microscopy, this approach allows the non-destructive measurement of macroscopic samples. The interface was found to have a single structure that is fully fourfold coordinated. X-ray diffraction data were measured at Beamline I07 at the Diamond Light Source

Journal Keywords: Crystals; Grain Boundaries; Interfaces; Silicon; Transmission Electron Microscopy; X-Ray Diffraction

Subject Areas: Physics, Materials, Technique Development


Instruments: I07-Surface & interface diffraction

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