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Optomechanical Design of a Multilayer Laue Lens Test Bed for 10-nm Focusing of Hard X-rays

DOI: 10.1088/1742-6596/463/1/012029 DOI Help

Authors: Deming Shu (Argonne National Laboratory) , Evgeny Nazaretski (Brookhaven National Laboratory) , Jungdae Kim (Brookhaven National Laboratory) , Hanfei Yan (Brookhaven National Laboratory) , Kenneth Lauer (Brookhaven National Laboratory) , Brian Mullany (Brookhaven National Laboratory) , Dennis Kuhne (Brookhaven National Laboratory) , Jörg Maser (Argonne National Laboratory) , Yong Chu (Brookhaven National Laboratory)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: 11th International Conference on X-ray Microscopy (XRM2012)
Peer Reviewed: No

State: Published (Approved)
Published: October 2013

Abstract: A multilayer Laue lens (MLL) test bed was designed at the Argonne National Laboratory for the National Synchrotron Light Source-II (NSLS-II) project at Brookhaven National Laboratory. Argonne and Brookhaven scientists and engineers collaborated to carry out this work in order to achieve NSLS-II's R&D goals of 10-nm focusing of hard x-rays. The test-bed design was based on the experience gained from the Argonne nanopositioning system designed for the CNM/APS hard x-ray nanoprobe project and an MLL test bed at Advanced Photon Source (APS) beamline 26-ID [1-3]. Optomechanical design of the MLL test bed, as well as the preliminary test results for the alignment apparatus and sample base stages' mechanical vibration performances are presented in this paper

Journal Keywords: Optomechanical Design Of A Multilayer Laue Lens Test Bed For 10-Nm Focusing Of Hard X-Rays

Subject Areas: Technique Development


Technical Areas: Optics