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Tests and characterization of a laterally graded multilayer Montel mirror

DOI: 10.1107/S1600577513024077 DOI Help
PMID: 24365912 PMID Help

Authors: K. Mundboth (Diamond Light Source) , J. Sutter (Diamond Light Source) , D. Laundy (Diamond Light Source) , S. Collins (Diamond Light Source) , S. Stoupin (Advanced Photon Source, Argonne National Laboratory) , Y. Shvyd'ko (Advanced Photon Source, Argonne National Laboratory)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation , VOL 21 , PAGES 16-23

State: Published (Approved)
Published: December 2013

Abstract: Multilayers are becoming an increasingly important tool in X-ray optics. The essential parameters to design a pair of laterally graded multilayer mirrors arranged in a Montel-type configuration for use as an X-ray collimating device are provided. The results of X-ray reflectometry tests carried out on the optics in addition to metrology characterization are also shown. Finally, using experimental data and combined with X-ray tracing simulations it is demonstrated that the mirror meets all stringent specifications as required for a novel ultra-high-resolution inelastic X-ray scattering spectrometer at the Advanced Photon Source.

Journal Keywords: X-Ray Optics; Collimating Optics; Montel Mirrors; Laterally Graded Multilayers; Kb Mirrors

Subject Areas: Technique Development, Physics, Materials


Instruments: B16-Test Beamline

Other Facilities: Advanced Photon Source

Added On: 16/12/2013 12:50

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