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In situ observation of the orientation relationship at the interface plane between substrate and nucleus using X-ray scattering techniques

DOI: 10.1016/j.scriptamat.2014.01.023 DOI Help

Authors: Adam Brown (University of Leicester) , Hongbiao Dong (University of Leicester) , Paul Howes (University of Leicester) , Chris Nicklin (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Scripta Materialia , VOL 77 , PAGES 60 - 63

State: Published (Approved)
Published: April 2014
Diamond Proposal Number(s): 6663 , 8107

Abstract: Orientation relationship at the interface plane between substrate and nucleus is an important factor influencing the potency of the substrate. We explored synchrotron X-ray scattering techniques to observe in situ the nucleation and early stage solidification behaviour when liquid is in contact with a specific crystal plane of a solid substrate. The diffraction data reveal the orientation relationship between the substrate and the nucleus, in particular the interface plane, and its influence on the required undercooling for nucleation.

Journal Keywords: Heterogeneous nucleation; X-ray diffraction; Orientation relationship; Nucleation undercooling; Aluminium

Subject Areas: Materials, Engineering, Physics

Instruments: I07-Surface & interface diffraction

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