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Microscopic origin of the reduced magnetocrystalline anisotropy with increasing oxide content in Co80Pt20:oxide thin films

DOI: 10.1088/0022-3727/46/40/405001 DOI Help

Authors: Wen Zhang (University of Twente) , Simon A Morton (Lawrence Berkeley National Laboratory) , P K Johnny Wong (University of Twente) , Bin Lu (Seagate Technology) , Yongbing Xu (University of York) , Michel P De Jong (University of Twente) , Wilfred G Van Der Wiel (University of Twente) , Gerrit Van Der Laan (Diamond Light Source)
Co-authored by industrial partner: Yes

Type: Journal Paper
Journal: Journal Of Physics D: Applied Physics , VOL 46 (40) , PAGES 405001

State: Published (Approved)
Published: October 2013

Abstract: Angle-dependent x-ray magnetic circular dichroism at the Co L2.3 edges has been utilized to systematically study Co80Pt20 :WO3 perpendicular magnetic recording thin films, in which the magnetocrystalline anisotropy significantly drops as the oxide volume fraction increases. The microscopic origin of this phenomenon in the studied films can be mainly attributed to an increase in orbital moment normal to the grain–oxide interface, with increasing oxide volume fraction, which arises from a more pronounced effect of symmetry breaking at the grain–oxide interface in smaller grains.

Journal Keywords: Anisotropy; Cobalt Tungstates; Crystal Structure; Magnetic Circular Dichroism; Platinum Compounds; Symmetry Breaking; Thin Films; Tungsten Oxides; X Radiation

Subject Areas: Physics, Energy, Materials

Facility: ALS