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Layer-resolved elemental-composition determination at the Co/V interface in Co/V/MgO(100)

DOI: 10.1016/j.susc.2008.10.018 DOI Help

Authors: M. Diaz (CSIC-ICMM) , E. Roman (CSIC-ICMM) , P. Bailey (STFC Daresbury Laboratory) , T. C. Q. Noakes (STFC Daresbury Laboratory) , A. Muñoz Martin (Centro de Microanálisis de Materiales, (CMAM-UAM)) , Y. Huttel (CSIC) , G. Van Der Laan (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Surface Science , VOL 602 (24) , PAGES L139-L144

State: Published (Approved)
Published: January 2008

Abstract: Medium energy ion scattering has been used to investigate the possible interdiffusion of Co and V at the Co/V interface in the Co/V/MgO(1 0 0) system at room temperature and after annealing in the temperature range from 100 to 500 °C. The Co and V composition and structure as a function of depth has been studied using two-dimensional maps of the scattered ion energy versus scattering angle and with the corresponding projections onto the angle axis over a small energy range (angle spectrum) and onto the energy axis over a small scattering angle range (energy spectrum). At room temperature only limited interdiffusion at the Co/V interface can be inferred from the analysis of the experimental data, while at 300 °C and higher drastic changes are observed at the Co/V interface in terms of sharpness and composition. Furthermore, a structural change is observed after annealing at 500 °C as a consequence of the V and/or Co interdiffusion.

Journal Keywords: Medium energy ion scattering (MEIS); Interdiffusion; Cobalt; Vanadium; Interface; Composition; Layer; Growth

Subject Areas: Physics

Technical Areas: