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Polarization effects in X-ray resonant magnetic scattering patterns from striped FePd films

DOI: 10.1016/j.physb.2003.11.042 DOI Help

Authors: K. Chesnel (DRFMC, CEA-Grenoble) , M. Belakhovsky (DRFMC, CEA-Grenoble) , A. Marty (DRFMC, CEA-Grenoble) , G. Beutier (DRFMC, CEA-Grenoble) , G. Van Der Laan (Diamond Light Source) , S. P. Collins (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Physica B: Condensed Matter , VOL 345 , PAGES 148-152

State: Published (Approved)
Published: December 2003

Abstract: We recorded X-ray resonant magnetic scattering (XRMS) patterns from a 40 nm thin FePd film that exhibits magnetic stripes with ?100 nm period. Measurements were performed using a CCD camera in reflection geometry for different light polarizations at the Fe L3 resonance. We observed dichroic effects using circular polarization. By combining the scattering patterns obtained with both helicities we obtain the symmetric and antisymmetric part of the pattern. The experimental results are in agreement with a simple theoretical model.

Journal Keywords: Nanotechnology; Magnetic stripes; XRMS; Polarization; Dichroism

Subject Areas: Physics


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