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Ronchi test for characterization of X-ray nanofocusing optics and beamlines

DOI: 10.1107/S160057751401323X DOI Help
PMID: 25177999 PMID Help

Authors: Fredrik Uhlén (KTH Royal Institute of Technology) , Jussi Rahomäki (KTH Royal Institute of Technology) , Daniel Nilsson (KTH Royal Institute of Technology) , Frank Seiboth (Technische Universität Dresden) , Claude Sanz (KTH Royal Institute of Technology) , Ulrich Wagner (Diamond Light Source) , Christoph Rau (Diamond Light Source) , Christian Schroer (Technische Universität Dresden) , Ulrich Vogt (KTH Royal Institute of Technology)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation

State: Published (Approved)
Published: June 2014
Diamond Proposal Number(s): 8488

Abstract: A Ronchi interferometer for hard X-rays is reported in order to characterize the performance of the nanofocusing optics as well as the beamline stability. Characteristic interference fringes yield qualitative data on present aberrations in the optics. Moreover, the visibility of the fringes on the detector gives information on the degree of spatial coherence in the beamline. This enables the possibility to detect sources of instabilities in the beamline like vibrations of components or temperature drift. Examples are shown for two different nanofocusing hard X-ray optics: a compound refractive lens and a zone plate.

Journal Keywords: Zone Plate; Compound Refractive Lens; Ronchi Interferometer.

Subject Areas: Physics

Instruments: I13-1-Coherence