Publication

Article Metrics

Citations


Online attention

Comparison of EM-CCD and scientific CMOS based camera systems for high resolution X-ray imaging and tomography applications

DOI: 10.1088/1748-0221/9/06/P06017 DOI Help

Authors: J. H. Tutt (Open University) , D. J. Hall (Open University) , M. R. Soman (Open University) , A. D. Holland (Open University) , T. Connolley (Diamond Light Source) , A. M. Evagora (XCAM) , A. M. Warren (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Instrumentation , VOL 9 , PAGES P06017 - P06017

State: Published (Approved)
Published: June 2014
Diamond Proposal Number(s): 8919

Abstract: We have developed an Electron Multiplying (EM) CCD based, high frame rate camera system using an optical lens system for X-ray imaging and tomography. The current state of the art systems generally use scientific CMOS sensors that have a readout noise of a few electrons and operate at high frame rates. Through the use of electron multiplication, the EM-CCD camera is able to operate with a sub-electron equivalent readout noise and a frame rate of up to 50 HZ (full-frame). The EM-CCD-based camera system has a major advantage over existing technology in that it has a high signal-to-noise ratio even at very low signal levels. This allows radiation-sensitive samples to be analysed with low flux X-ray beams which greatly reduces the beam damage. This paper shows that under the conditions of this experiment the EM-CCD camera system has a comparable spatial resolution performance to the scientific CMOS based imaging system and has a superior signal-to-noise ratio.

Journal Keywords: Beams; Cameras; Charge-Coupled Devices; Comparative Evaluations; Currents; Damage; Electrons; Noise; Readout Systems; Sensors; Signals; Signal-To-Noise Ratio; Spatial Resolution; Tomography; X Radiation

Subject Areas: Physics, Technique Development


Instruments: B16-Test Beamline