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Characterising ultrathin ceria films at the nanoscale: Combining spectroscopy and microscopy

DOI: 10.1016/j.elspec.2014.03.014 DOI Help

Authors: David C. Grinter (University College London) , Chi L. Pang (University College London) , Chris Muryn (University of Manchester) , Francesco Maccherozzi (Diamond Light Source) , Sarnjeet Dhesi (Diamond Light Source) , Geoff Thornton (University College London)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Electron Spectroscopy And Related Phenomena , VOL 195 , PAGES 13 - 17

State: Published (Approved)
Published: August 2014

Abstract: CeO2−x(1 1 1) ultrathin films consisting of small, discrete islands decorating a Pt(1 1 1) substrate have been studied using a combination of Scanning Tunnelling Microscopy, Low-Energy Electron Microscopy, and Low-Energy Electron Diffraction. Significantly, the chemical nature of the ceria film has also been probed using X-ray Absorption Spectroscopy (XAS) combined with X-ray PhotoEmission Electron Microscopy (XPEEM) in the same ultrahigh vacuum system. XAS spectra over the Ce M5 absorption edge demonstrated that the ceria islands contained ∼50% Ce4+and ∼50% Ce3+, leading to an overall stoichiometry of CeO1.75, which was uniform across the film. The unique advantage of this experimental setup is the application of multiple techniques on the same sample: high-resolution STM to monitor the morphology, XPEEM to probe the stoichiometry, and LEEM to act as a bridge between the two.

Journal Keywords: STM; Xpeem; Absorption Spectroscopy; Cerium Ions; Cerium Oxides; Crystal Structure; Electron Diffraction; Electron Microscopy; Electrons; Morphology; Nanostructures; Photoemission; Platinum; Scanning Tunneling Microscopy; Substrates; Thin Films; Valence

Subject Areas: Chemistry, Physics, Materials

Instruments: I06-Nanoscience

Added On: 28/11/2014 19:29

Discipline Tags:

Surfaces Technique Development - Materials Science Physics Physical Chemistry Technique Development - Chemistry Catalysis Chemistry Materials Science interfaces and thin films

Technical Tags:

Diffraction Microscopy Low Energy Electron Diffraction (LEED) Electron Microscopy (EM) PhotoEmmission Electron Microscopy (PEEM)