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X-ray magnetic spectroscopy of MBE-grown Mn-doped Bi2Se3 thin films

DOI: 10.1063/1.4904900 DOI Help

Authors: Liam Collins-mcintyre (University of Oxford) , M. D. Watson (University of Oxford) , A. A. Baker (University of Oxford) , S. L. Zhang , A. I. Coldea (University of Oxford) , S. E. Harrison (Stanford University) , A. Pushp (IBM Almaden Research Center) , A. J. Kellock (IBM Almaden Research Center) , S. S. P. Parkin (IBM Almaden Research Center) , Gerrit Van Der Laan (Diamond Light Source) , Thorsten Hesjedal (University of Oxford)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: AIP Advances , VOL 4 (12)

State: Published (Approved)
Published: December 2014
Diamond Proposal Number(s): 8529

Open Access Open Access

Abstract: We report the growth of Mn-doped Bi2Se3 thin films by molecular beam epitaxy (MBE), investigated by x-ray diffraction (XRD), atomic force microscopy (AFM), SQUID magnetometry and x-ray magnetic circular dichroism (XMCD). Epitaxial films were deposited on c-plane sapphire substrates by co-evaporation. The films exhibit a spiral growth mechanism typical of this material class, as revealed by AFM. The XRD measurements demonstrate a good crystalline structure which is retained upon doping up to ¡­7.5 atomic-% Mn, determined by Rutherford backscattering spectrometry (RBS), and show no evidence of the formation of parasitic phases. However an increasing interstitial incorporation of Mn is observed with increasing doping concentration. A magnetic moment of 5.1 ¥ìB/Mn is obtained from bulk-sensitive SQUID measurements, and a much lower moment of 1.6 ¥ìB/Mn from surface-sensitive XMCD. At ¡­2.5 K, XMCD at the Mn L2,3 edge, reveals short-range magnetic order in the films and indicates ferromagnetic order below 1.5 K.

Journal Keywords: Atomic Force Microscopy; Bismuth Selenides; Deposits; Doped Materials; Evaporation; Magnetic Circular Dichroism; Magnetic Moments; Molecular Beam Epitaxy; Rutherford Backscattering Spectroscopy; Sapphire; Squid Devices; Substrates; Thin Films; X Radiation; X-Ray Diffraction

Subject Areas: Physics, Materials, Engineering


Instruments: I10-Beamline for Advanced Dichroism

Other Facilities: No