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In situ micro-focused X-ray beam characterization with a lensless camera using a hybrid pixel detector

DOI: 10.1107/S1600577513034759 DOI Help
PMID: 24562554 PMID Help

Authors: Anton Kachatkou (School of Electrical and Electronic Engineering, The University of Manchester) , Julien Marchal (Diamond Light Source) , Roelof Van Silfhout (School of Electrical and Electronic Engineering, The University of Manchester)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation , VOL 21 , PAGES 333 - 339

State: Published (Approved)
Published: March 2014
Diamond Proposal Number(s): 517427

Open Access Open Access

Abstract: Results of studies on micro-focused X-ray beam diagnostics using an X-ray beam imaging (XBI) instrument based on the idea of recording radiation scattered from a thin foil of a low-Z material with a lensless camera are reported. The XBI instrument captures magnified images of the scattering region within the foil as illuminated by the incident beam. These images contain information about beam size, beam position and beam intensity that is extracted during dedicated signal processing steps. In this work the use of the device with beams for which the beam size is significantly smaller than that of a single detector pixel is explored. The performance of the XBI device equipped with a state-of-the-art hybrid pixel X-ray imaging sensor is analysed. Compared with traditional methods such as slit edge or wire scanners, the XBI micro-focused beam characterization is significantly faster and does not interfere with on-going experiments. The challenges associated with measuring micrometre-sized beams are described and ways of optimizing the resolution of beam position and size measurements of the XBI instrument are discussed.

Journal Keywords: X-Ray Imaging; Pinhole Camera; Beam Diagnostics; Micro-Focus; ScatteringĀ Measurements; Beam Size Measurements; Accidents; Biomedical Radiography; Cameras; Equipment; Hybridization; Images; Scattering; X Radiation

Subject Areas: Technique Development

Instruments: B16-Test Beamline

Added On: 30/01/2015 08:18


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