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Texture analysis of thick bismuth ferrite lead titanate layers

DOI: 10.1109/ISAF.2014.6922999 DOI Help

Authors: Meghdad Palizdar (University of Leeds) , Dhiman Mallick (Tyndall National Institute Cork, Ireland) , Tuhin Maity (Tyndall National Institute Cork, Ireland) , Saibal Roy (Tyndall National Institute Cork, Ireland) , Tim Comyn (University of Leeds) , Timothy Stevenson (University of Leeds) , Chris M. Fancher (North Carolina State University) , Jacob L. Jones (North Carolina State University) , Stephen F. Poterala (Pennsylvania State University) , Gary L. Messing (Pennsylvania State University) , Ender Suvaci (Anadolu University) , Annette Kleppe (Diamond Light Source) , Andrew Jephcoat (Diamond Light Source) , Andrew J Bell (University of Leeds)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: 2014 Joint IEEE International Symposium on the Applications of Ferroelectrics
Peer Reviewed: No

State: Published (Approved)
Published: May 2014

Abstract: The template grain growth technique was used to synthesis textured 60BiFeO 3 -PbTiO 3 (60:40BFPT) by using platelets of BaTiO 3 as template. Synchrotron measurement clearly showed textured 60:40BFPT. Moreover, in situ high energy synchrotron radiation was employed to investigate the influence of an external electric filed on crystallographic structure of mixed phase 60:40BFPT. Application of an electric field ≥ 1 kV/mm resulted in phase transformation from mixed rhombohedral/tetragonal phases (≈ 73.5% tetragonal / 26.5% rhombohedral) to predominately tetragonal phase (≈ 95%) at applied field of 6 kV/mm. A crystallographic texture refinement was done by using software package materials analysis using diffraction (MAUD) with a 4 th order spherical harmonic orientation distribution function (ODF). This refinement was completed using a P4mm+Cm structure model. Texture coefficients were constrained such that the equivalent texture coefficients of each phase are the same. The resulting texture refinement determined that sample has a 1.3 multiples of random distribution (MRD) {100} crystallographic texture.

Subject Areas: Materials


Instruments: I15-Extreme Conditions