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Defect-dependent colossal negative thermal expansion in UiO-66(Hf) metal–organic framework

DOI: 10.1039/C5CP01307K DOI Help

Authors: Matthew Cliffe (University of Oxford) , Joshua A Hill (University of Oxford) , Claire Murray (Diamond Light Source) , François-xavier Coudert (Chimie ParisTech–CNRS) , Andrew Goodwin (University of Oxford)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Physical Chemistry Chemical Physics

State: Published (Approved)
Published: April 2015
Diamond Proposal Number(s): 9940

Abstract: Thermally–densified hafnium terephthalate UiO-66(Hf) is shown to exhibit the strongest isotropic negative thermal expansion (NTE) effect yet reported for a metal–organic framework (MOF). Incorporation of correlated vacancy defects within the framework affects both the extent of thermal densification and the magnitude of NTE observed in the densified product. We thus demonstrate that defect inclusion can be used to tune systematically the physical behaviour of a MOF.

Subject Areas: Chemistry, Physics


Instruments: I11-High Resolution Powder Diffraction