Data Analysis WorkbeNch (DAWN)

DOI: 10.1107/S1600577515002283
PMID: 25931106

Authors: Mark Basham (Diamond Light Source) , Jacob Filik (Diamond Light Source) , Michael Wharmby (Diamond Light Source) , Peter Chang (Diamond Light Source) , Baha El Kassaby (Diamond Light Source) , Matt Gerring (Diamond Light Source) , Jun Aishima (Diamond Light Source) , Karl Levik (Diamond Light Source) , Bill Pulford (Diamond Light Source) , Irakli Sikharulidze (Diamond Light Source) , Duncan Sneddon (Diamond Light Source) , Matthew Webber (Diamond Light Source) , Sarnjeet Dhesi (Diamond Light Source) , Francesco Maccherozzi (Diamond Light Source) , Olof Svensson (ESRF) , Sandor Brockhauser (EMBL) , Gabor Náray (EMBL) , Alun Ashton (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation , VOL 22 , PAGES 828-838

State: Published (Approved)
Published: May 2015

Abstract: Synchrotron light source facilities worldwide generate terabytes of data in numerous incompatible data formats from a wide range of experiment types. The Data Analysis WorkbeNch (DAWN) was developed to address the challenge of providing a single visualization and analysis platform for data from any synchrotron experiment (including single-crystal and powder diffraction, tomography and spectroscopy), whilst also being sufficiently extensible for new specific use case analysis environments to be incorporated (e.g. ARPES, PEEM). In this work, the history and current state of DAWN are presented, with two case studies to demonstrate specific functionality. The first is an example of a data processing and reduction problem using the generic tools, whilst the second shows how these tools can be targeted to a specific scientifc area.

Journal Keywords: software; DAWN; visualisation; analysis.

Subject Areas: Information and Communication Technology


Instruments: I06-Nanoscience (XPEEM)

Added On: 13/04/2015 14:22

Discipline Tags:

Computing & software technologies Information & Communication Technologies Data processing

Technical Tags:

Microscopy Electron Microscopy (EM) PhotoEmmission Electron Microscopy (PEEM)