Publication

Article Metrics

Citations


Online attention

Two-dimensional Cs-vacancy superstructure in iron-based superconductor

DOI: 10.1103/PhysRevB.91.144114 DOI Help

Authors: Daniel Porter (Diamond Light Source) , Eron Cemal (Royal Holloway, University of London) , David Voneshen (Royal Holloway, University of London) , Keith Refson (Rutherford Appleton Laboratory; University of London) , Matthias Gutmann (Rutherford Appleton Laboratory) , Alessandro Bombardi (Diamond Light Source) , Andrew Boothroyd (University of Oxford) , A. Krzton-Maziopa (Warsaw University of Technology) , E. Pomjakushina (Paul Scherrer Institute) , K. Conder (Paul Scherrer Institute) , Jon Goff (Royal Holloway and Bedford New College)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Physical Review B , VOL 91 (14)

State: Published (Approved)
Published: April 2015
Diamond Proposal Number(s): 8686 , 10377

Abstract: Single crystal neutron diffraction is combined with synchrotron x-ray scattering to identify the different superlattice phases present in Cs 0.8 Fe 1.6 Se 2 . A combination of single crystal refinements and first principles modeling are used to provide structural solutions for the √ 5 × √ 5 and √ 2 × √ 2 superlattice phases. The √ 5 × √ 5 superlattice structure is predominantly composed of ordered Fe vacancies and Fe distortions, whereas the √ 2 × √ 2 superlattice is composed of ordered Cs vacancies. The Cs vacancies only order within the plane, causing Bragg rods in reciprocal space. By mapping x-ray diffraction measurements with narrow spatial resolution over the surface of the sample, the structural domain pattern was determined, consistent with the notion of a majority antiferromagnetic √ 5 × √ 5 phase and a superconducting √ 2 × √ 2 phase.

Diamond Keywords: Antiferromagnetism

Subject Areas: Physics, Materials


Instruments: I16-Materials and Magnetism

Other Facilities: SXD at ISIS

Added On: 01/05/2015 11:40

Discipline Tags:

Superconductors Quantum Materials Physics Magnetism Materials Science

Technical Tags:

Diffraction