Publication

Article Metrics

Citations


Online attention

Photoelectron spectroscopy of transition metal oxide interfaces

DOI: 10.1051/epjap/2015150075 DOI Help

Authors: Jorg Zegenhagen (ESRF)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: The European Physical Journal Applied Physics , VOL 70 (2)

State: Published (Approved)
Published: May 2015

Open Access Open Access

Abstract: In the present paper we review applications of the photoelectron spectroscopy (PES) technique to the investigation of transition metal oxide (TMO) interfaces. We summarize very briefly some of the principle, specific characteristics of TMOs. Because of the buried nature of the interfaces, the photoelectrons must penetrate certain thicknesses of material, which is easier with higher kinetic energies in the keV range. Thus, we also briefly summarize some of the hallmarks of hard X-ray photoelectron spectroscopy (HAXPES), before presenting four explicit samples of the analysis of TMO interfaces.

Subject Areas: Chemistry, Physics


Instruments: NONE-No attached Diamond beamline

Other Facilities: ESRF

Discipline Tags:



Technical Tags: