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In-operando x-ray tomography study of lithiation induced delamination of Si based anodes for lithium-ion batteries

DOI: 10.1149/2.0081407eel DOI Help

Authors: Farid Tariq (Imperial College London) , Vladimir Yufit (Imperial College London) , David Eastwood (University of Manchester) , Yu Merla (Imperial College London) , Moshiel Biton (Imperial College London) , Billy Wu (Imperial College London) , Zhangwei Chen (Imperial College London) , Kathrin Freedman (Tel Aviv University) , Gregory Offer (Imperial College London) , Emanuel Peled (Tel Aviv University) , Peter Lee (University of Manchester) , Diana Golodnitsky (Tel Aviv University) , Nigel Brandon (Imperial College London)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Ecs Electrochemistry Letters , VOL 3 (7) , PAGES A76 - A78

State: Published (Approved)
Published: May 2014

Abstract: Silicon-Lithium based rechargeable batteries offer high gravimetric capacity. However cycle life and electrode microstructure failure mechanisms remain poorly understood. Here we present an X-ray tomography method to investigate in-operando lithiation induced stress cracking leading to the delamination of a composite Si based electrode. Simultaneous voltage measurements show increased cell resistance correlating with severe delamination and microstructural changes. 3D analysis revealed 44.1% loss of the initial electrode-current collector area after 1 hour of operation at 2.4 mA/cm2 and a 21.2% increase in new anode surface area. The work represents a new basis for future investigation of Si based anodes.

Journal Keywords: Batteries And Energy Storage

Diamond Keywords: Batteries; Lithium-ion

Subject Areas: Energy, Materials, Chemistry
Collaborations: Diamond Manchester

Technical Areas:

Added On: 16/09/2015 12:23

Discipline Tags:

Energy Storage Energy Physical Chemistry Energy Materials Chemistry Materials Science

Technical Tags: