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Exploration of crystal strains using coherent x-ray diffraction

DOI: 10.1088/1367-2630/12/3/035022 DOI Help

Authors: Wonsuk Cha (Department of Physics, Sogang University) , Sanghoon Song (Interdisciplinary Program of Integrated Biotechnology, Sogang University, Seoul) , Nak Cheon Jeong (Department of Chemistry, Sogang University, Seoul) , Ross Harder (Advanced Photon Source) , Kyung Byung Yoon (Department of Chemistry, Sogang University, Seoul) , Ian Robinson (Diamond Light Source) , Hyunjung Kim (Department of Physics, Sogang University, Seoul)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: New Journal Of Physics , VOL 12

State: Published (Approved)
Published: March 2010

Abstract: We measured coherent x-ray diffraction (CXD) on zeolite microcrystals in order to gain information on internal density distribution and to learn more about the strain developed during the synthesis and attachment process on the substrate. From the distortion and asymmetry of the diffraction pattern on the (020) Bragg peak, the strain field distribution is estimated. We inverted the diffraction patterns from a less strained crystal to obtain the three-dimensional image of the shape and internal strain fields using the error reduction and hybrid input–output phase retrieval algorithms. We also show a few examples of characteristic distortion modes relevant to CXD of zeolites.

Subject Areas: Materials, Technique Development

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Added On: 16/04/2010 12:02

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