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Synchrotron based reciprocal space mapping and dislocation substructure analysis

DOI: 10.1016/j.matlet.2009.02.014 DOI Help

Authors: Sophie Eve (CRISMAT ENSICAEN) , Steve Collins (Diamond Light Source) , Alexander Korsunsky (University of Oxford) , Felix Hofmann (University of Oxford) , Xu Song (University of Oxford)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Materials Letters , VOL 63 (12) , PAGES 1077-1081

State: Published (Approved)
Published: February 2009

Abstract: During plastic deformation of FCC materials, dislocation density does not evolve uniformly but a dislocation cell/wall structure is formed. X-ray diffraction reciprocal space mapping is used to investigate this substructure within a single grain in a large grained aluminium polycrystal. A simple dislocation cell/wall model capable of computing numerical reciprocal space maps is presented. The model qualitatively captures the experimentally observed features. (C) 2009 Elsevier B.V. All rights reserved.

Journal Keywords: Characterisation Methods; Crystal Structure; Defects; X-Ray Techniques; Reciprocal Space Map; Dislocation Substructure

Subject Areas: Engineering


Instruments: I16-Materials and Magnetism