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Characterizing Synchrotron Optics at Diamond Light Source

DOI: 10.1080/08940880903547330 DOI Help

Authors: Simon Alcock (Diamond Light Source) , Geoff Ludbrook (Diamond Light Source) , Kawal Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Magazine Article
Magazine: Synchrotron Radiation News

State: Published (Approved)
Published: February 2010

Abstract: High brilliance, third generation synchrotrons, such as Diamond Light Source, the UK's national facility, are designed to produce intense beams of infra-red, ultra violet, and X-rays to benefit a wide variety of scientific investigations. In November 2009, 15 beamlines were operational and generating world-class academic and industrial research. By 2012, a further seven beamlines will be welcoming users. The successful scientific exploitation of the intense synchrotron light depends to a significant extent on the quality and performance of beamline optics. As synchrotron beamlines strive to produce micrometer-, and ultimately nanometer-sized focal spots, there is a pressing need for state-of-the-art optics, and the metrology instruments to accurately characterize them.

Journal Keywords: Diamond; Metrology; Synchnrotron Optics

Subject Areas: Technique Development

Technical Areas: Optics

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