X-ray nanotomography using near-field ptychography

DOI: 10.1364/OE.23.012720
PMID: 26074526

Authors: Marco Stockmar (Technische Universität München) , Maxime Hubert (ESRF) , Martin Dierolf (TU Munich) , Bjorn Enders (TU Munich) , Richard Clare (TU Munich) , Sebastian Allner (TU Munich) , Andreas Fehringer (TU Munich) , Irene Zanette (Diamond Light Source; TU Munich) , Julie Villanova (ESRF) , Jérôme Laurencin (Univ. Grenoble Alpes - CEA) , Peter Cloetens (ESRF) , Franz Pfeiffer (TU Munich) , Pierre Thibault (University College London (UCL))
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Optics Express , VOL 23

State: Published (Approved)
Published: May 2015

Abstract: Propagation-based imaging or inline holography in combination with computed tomography (holotomography) is a versatile tool to access a sample’s three-dimensional (3D) micro or nano structure. However, the phase retrieval step needed prior to tomographic reconstruction can be challenging especially for strongly absorbing and refracting samples. Near-field ptychography is a recently developed phase imaging method that has been proven to overcome this hurdle in projection data. In this work we extend near-field ptychography to three dimensions and we show that, in combination with tomography, it can access the nano structure of a solid oxide fuel cell (SOFC). The quality of the resulting tomographic data and the structural properties of the anode extracted from this volume were compared to previous results obtained with holotomography. This work highlights the potential of 3D near-field ptychography for reliable and detailed investigations of samples at the nanometer scale, with important applications in materials and life sciences among others.

Subject Areas: Physics

Facility: ID22 at ESRF

Added On: 12/01/2016 12:42

Documents:
oe-23-10-12720.pdf

Discipline Tags:

Physics

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