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Atomic structure of CaF2/MnF2–Si(1 1 1) superlattices from X-ray diffraction

DOI: 10.1016/j.apsusc.2006.08.040 DOI Help

Authors: Simon Alcock (Diamond Light Source) , Chris Nicklin (Diamond Light Source) , Paul Howes (University of Leicester) , Colin Norris (Diamond Light Source) , R N Kyutt (Physical-Technical Institute of Russian Academy of Sciences) , N S Sokolov (Physical-Technical Institute of Russian Academy of Sciences) , N I Yakovlev (Institute of Materials Research and Engineering)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Applied Surface Science , VOL 253 (8) , PAGES 3991 - 3999

State: Published (Approved)
Published: February 2007

Abstract: X-ray reflectivity and non-specular crystal truncation rod scans have been used to determine the three-dimensional atomic structure of the buried CaF2–Si(1 1 1) interface and ultrathin films of MnF2 and CaF2 within a superlattice. We show that ultrathin films of MnF2, below a critical thickness of approximately four monolayers, are crystalline, pseudomorphic, and adopt the fluorite structure of CaF2. High temperature deposition of the CaF2 buffer layer produces a fully reacted, CaF2–Si(1 1 1) type-B interface. The mature, “long” interface is shown to consist of a partially occupied layer of CaF bonded to the Si substrate, followed by a distorted CaF layer. Our atomistic, semi-kinematical scattering method extends the slab reflectivity method by providing in-plane structural information.

Journal Keywords: Superlattice; MnF2; CaF2; Crystal truncation rods; Buffers; Calcium Compounds; Calcium Fluorides; Crystals; Deposition; Fluorine Compounds; Fluorite; Layers; Manganese Compounds; Manganese Fluorides; Reflectivity; Silicon; Substrates; Tempe

Subject Areas: Physics

Facility: ESRF