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Ultra-high-resolution inelastic X-ray scattering at high-repetition-rate self-seeded X-ray free-electron lasers

DOI: 10.1107/S1600577515024844 DOI Help
PMID: 26917127 PMID Help

Authors: Oleg Chubar (Brookhaven National Laboratory) , Gianluca Geloni (European X-ray Free-Electron Laser) , Vitali Kocharyan (Deutsches Elektronen-Synchrotron) , Anders Madsen (European X-ray Free-Electron Laser) , Evgeni Saldin (Deutsches Elektronen-Synchrotron) , Svitozar Serkez (Deutsches Elektronen-Synchrotron) , Yuri Shvyd'ko (Advanced Photon Source) , John Sutter (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation , VOL 23 (2)

State: Published (Approved)
Published: March 2016

Open Access Open Access

Abstract: Inelastic X-ray scattering (IXS) is an important tool for studies of equilibrium dynamics in condensed matter. A new spectrometer recently proposed for ultra-high-resolution IXS (UHRIX) has achieved 0.6?meV and 0.25?nm(-1) spectral and momentum-transfer resolutions, respectively. However, further improvements down to 0.1?meV and 0.02?nm(-1) are required to close the gap in energy-momentum space between high- and low-frequency probes. It is shown that this goal can be achieved by further optimizing the X-ray optics and by increasing the spectral flux of the incident X-ray pulses. UHRIX performs best at energies from 5 to 10?keV, where a combination of self-seeding and undulator tapering at the SASE-2 beamline of the European XFEL promises up to a 100-fold increase in average spectral flux compared with nominal SASE pulses at saturation, or three orders of magnitude more than what is possible with storage-ring-based radiation sources. Wave-optics calculations show that about 7 * 10(12)?photons?s(-1) in a 90?eV bandwidth can be achieved on the sample. This will provide unique new possibilities for dynamics studies by IXS.

Subject Areas: Physics

Facility: APS

Added On: 16/02/2016 11:29

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