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Simulations of multi-contrast x-ray imaging using near-field speckles
Authors:
Marie- Christine
Zdora
(Diamond Light Source)
,
Pierre
Thibault
(University College London (UCL))
,
Julia
Herzen
(Technische Universität München)
,
Franz
Pfeiffer
(Technische Universität München)
,
Irene
Zanette
(Diamond Light Source)
Co-authored by industrial partner:
No
Type:
Conference Paper
Conference:
XRM 2014
Peer Reviewed:
No
State:
Published (Approved)
Published:
January 2016
Abstract: X-ray dark-field and phase-contrast imaging using near-field speckles is a novel technique that overcomes limitations inherent in conventional absorption x-ray imaging, i.e. poor contrast for features with similar density. Speckle-based imaging yields a wealth of information with a simple setup tolerant to polychromatic and divergent beams, and simple data acquisition and analysis procedures. Here, we present a simulation software used to model the image formation with the speckle-based technique, and we compare simulated results on a phantom sample with experimental synchrotron data. Thorough simulation of a speckle-based imaging experiment will help for better understanding and optimising the technique itself.
Journal Keywords: x-ray microscopy; phase-contrast imaging; dark-field imaging; near-field speckles; wavefront simulations; synchrotron radiation
Subject Areas:
Physics,
Technique Development
Technical Areas:
Added On:
25/02/2016 11:45
Discipline Tags:
Physics
Technique Development - Physics
Technical Tags: