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Achieving and Measuring Sub-Micrometer Beam Stability at 3rd Generation Light Sources

DOI: 10.1088/1742-6596/425/4/042001 DOI Help

Authors: Guenther Rehm (Diamond Light Source)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: 11th International Conference on Synchrotron Radiation Instrumentation (SRI 2012)
Peer Reviewed: No

State: Published (Approved)
Published: March 2013

Abstract: Electron beam stability at the source points of synchrotron radiation is an accepted requirement for the preservation of the low emittance provided in 3rd generation light sources. With emittances approaching 1nm rad this typically requires sub micrometer positional stability at the source point over time scales from milliseconds to at least hours and ideally much longer. These challenges are routinely met by the use of fast orbit feedback systems. This contribution sets out to first establish a relevant representation of stability over many orders of magnitude in time and looks at available stable references. To complement this, data on the electron and X-ray beam stability achieved at various operational light sources is compared.

Journal Keywords: Electron Beams; Feedback; Light Sources; Preservation; Stability; Synchrotron Radiation; X Radiation

Subject Areas: Physics, Technique Development

Technical Areas:

Added On: 25/02/2016 15:45

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