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Probing the average size of self-assembled metal nanoparticles using x-ray standing waves

DOI: 10.1103/PhysRevB.80.035434 DOI Help

Authors: M. K. Tiwari (Diamond Light Source) , K. J. S. Sawhney (Diamond Light Source) , T.-l. Lee (Diamond Light Source) , S. G. Alcock (Diamond Light Source) , G. S. Lodha (Raja Ramanna Centre for Advanced Technology)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Physical Review B , VOL 80 (3) , PAGES 035434

State: Published (Approved)
Published: July 2009

Abstract: We report application of x-ray standing-wave field for characterization of average vertical size of metal nanoparticles dispersed on a substrate surface with accuracies better than 1 nm. This method is applied to analyze the distribution of Fe, Co, and Au nanoparticles on Si substrate and W/C multilayer substrates. Results demonstrate that the method is a valuable tool to evaluate the surface morphology of nanoparticles over a large surface area. Unlike conventional probes such as atomic force microscopy or microinterferometry, the present method provides element-specific analysis. It also has the advantage of being able to examine nanoparticles in a liquid medium, or buried inside a coating layer. We anticipate that the proposed method has great potential to infer the internal structure of nanoparticles.

Subject Areas: Technique Development


Instruments: B16-Test Beamline